The influence of aberrations in third harmonic generation microscopy

Journal of Optics

Volumn 12, Issue 8, 2010, Pages

  Thayil, Anisha ^a   Jesacher, Alexander ^a   Wilson, Tony ^a   Booth, Martin J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberrations; Adaptive optics; Harmonic generation; Microscopy

Indexed keywords

ABERRATIONS; ADAPTIVE OPTICS; HARMONIC ANALYSIS; MICROSCOPIC EXAMINATION;

ABERRATION CORRECTION; COHERENCE LENGTHS; IMAGE INTENSITIES; MICROSCOPE IMAGES; SIGNAL INTENSITIES; SPECIMEN GEOMETRY; SPECIMEN STRUCTURES; THIRD-HARMONIC GENERATION MICROSCOPY;

HARMONIC GENERATION;

EID: 78649602810     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/12/8/084009     Document Type: Article

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