Determination of material properties by use of third-harmonic generation microscopy

Journal of the Optical Society of America B: Optical Physics

Volumn 19, Issue 7, 2002, Pages 1627-1634

  Schins, J M ^a   Schrama, T ^a   Squier, J ^b   Brakenhoff, G J ^a   Muller M ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; HARMONIC GENERATION; INTERFACES (MATERIALS);

THIRD HARMONIC GENERATION;

LASER PULSES;

EID: 0012344015     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.19.001627     Document Type: Article

References (13)

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