Characterizing specimen induced aberrations for high NA adaptive optical microscopy

Optics Express

Volumn 12, Issue 26, 2004, Pages 6540-6552

  Schwertner, M ^a   Booth, M J ^a   Wilson, T ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ADAPTIVE OPTICS; ADAPTIVE SYSTEMS; ELECTROMAGNETIC WAVE DIFFRACTION; FLUORESCENCE; INTERFEROMETERS; OPTICAL MICROSCOPY; REFRACTIVE INDEX;

CONFOCAL MICROSCOPY; SCANNING MICROSCOPY; ZERNIKE MODES;

LENSES;

EID: 11244249575     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.006540     Document Type: Article

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