Algorithms for the calculation of X-ray diffraction patterns from finite element data

Journal of Applied Crystallography

Volumn 43, Issue 6, 2010, Pages 1287-1299

  Wintersberger, E ^a   Kriegner, D ^a   Hrauda, N ^a   Stangl, J ^a   Bauer, G ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

dislocations; finite element method; nanostructure; simulations; X ray diffraction

Indexed keywords

DEFORMATION FIELD; DIFFRACTION DATA; DISLOCATIONS; DISPLACEMENT FIELD; EFFICIENT SIMULATION; FINITE ELEMENT; INTENSITY DISTRIBUTION; PBTE; PERIODIC ARRAYS; QUANTUM DOT; RIPPLE STRUCTURE; SCATTERED INTENSITY; SI SUBSTRATES; SIGE LAYERS; SIMULATION PRACTICES; SIMULATIONS; SPACE MAPS; STANDARD TOOLS; TWO-DIMENSIONAL CCD;

ALGORITHMS; DIFFRACTION PATTERNS; INTERFEROMETRY; NANOSTRUCTURES; THREE DIMENSIONAL; X RAY DIFFRACTION; X RAYS;

FINITE ELEMENT METHOD;

SIGE;

EID: 78649515245     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810032802     Document Type: Article

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