Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

Applied Physics Letters

Volumn 96, Issue 13, 2010, Pages

  Wintersberger, E ^a   Hrauda, N ^a   Kriegner, D ^a   Keplinger, M ^a   Springholz, G ^a   Stangl, J ^a   Bauer, G ^a   Oswald, J ^b   Belytschko, T ^b   Deiter, C ^c   Bertram, F ^c   Seeck, O H ^c  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b Northwestern University   (United States)

^c DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CDTE; DIFFRACTED X-RAY INTENSITY; DISLOCATION NETWORKS; EXTENDED FINITE ELEMENT METHOD; FINITE ELEMENT MODELING; MODEL SYSTEM; NARROW DISTRIBUTION; PBTE; SCATTERED INTENSITY; SHORT RANGE ORDERS;

CADMIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FINITE ELEMENT METHOD;

EID: 77950475248     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3379298     Document Type: Article

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17. L in our case is much smaller then the mean distance 〈L〉 a Gaussian distribution gives virtually the same results.