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Volumn 112, Issue 3, 2010, Pages 441-470

International Knowledge Diffusion and Home-bias Effect: Do USPTO and EPO Patent Citations Tell the Same Story?

Author keywords

Diffusion; Knowledge flows; O31; O33; O34; Patent citations; Patents; Spillovers

Indexed keywords

KNOWLEDGE; SPILLOVER EFFECT; TECHNOLOGY DIFFUSION;

EID: 78649465554     PISSN: 03470520     EISSN: 14679442     Source Type: Journal    
DOI: 10.1111/j.1467-9442.2010.01614.x     Document Type: Article
Times cited : (78)

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