X-ray grating interferometer for imaging at a second-generation synchrotron radiation source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7804, Issue , 2010, Pages

  Herzen, Julia ^a,b   Beckmann, Felix ^a   Donath, Tilman ^c,d   Ogurreck, Malte ^a   David, Christian ^d   Pfeiffer, Franz ^b   Mohr, Jürgen ^e   Reznikova, Elena ^e   Riekehr, Stefan ^a   Haibel, Astrid ^a   Schulz, Georg ^f   Müller, Bert ^f   Schreyer, Andreas ^a  

^a INSTITUTE OF MATERIALS RESEARCH   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c Dectris AG   (Switzerland)

^d PAUL SCHERRER INSTITUTE   (Switzerland)

^e KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^f UNIVERSITY OF BASEL   (Switzerland)

Author keywords

grating interferometer; laser beam weld; materials science; Phase contrast; soft tissue imaging; synchrotron radiation

Indexed keywords

BEAM LINES; GERMANY; GRATING INTERFEROMETERS; HARWI II; HIGH FLUX; HIGH POTENTIAL; INTERNAL STRUCTURE; LARGE FIELD OF VIEWS; LOW-COHERENCE; MONOCHROMATIC RADIATION; NON-COHERENT; OFF-AXIS; PHASE CONTRAST TOMOGRAPHY; PHASE CONTRASTS; PHASE-CONTRAST IMAGING; RADIATION SOURCE; SOFT TISSUE; SYNCHROTRON RADIATION BEAMLINE; SYNCHROTRON RADIATION SOURCE; SYNCHROTRON STORAGE RING; THIRD GENERATION; WEAKLY ABSORBING MATERIALS; X-RAY GRATING INTERFEROMETERS; X-RAY PHASE;

IMAGING SYSTEMS; INTERFEROMETERS; LASER BEAMS; MAGNESIUM; MATERIALS; QUANTUM OPTICS; RADIATION; RADIOLOGY; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY; WELDING; WELDS; X RAYS;

X RAY RADIOGRAPHY;

EID: 78649419729     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.860733     Document Type: Conference Paper

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