|
|
Volumn 51, Issue 10, 2010, Pages 1914-1918
|
|
Equal channel angular extrusion technique for controlling the texture of n-Type Bi2Te3 based thermoelectric materials
|
|
Author keywords
Bismuth telluride; Equal channel angular extrusion; Orientation imaging microscopy
|
|
Indexed keywords
ARGON ATMOSPHERES;
AVERAGE GRAIN SIZE;
BASAL PLANES;
BISMUTH TELLURIDE;
DEGREE OF ORIENTATION;
ECAE PROCESS;
EQUAL CHANNEL ANGULAR EXTRUSION;
EXTRUSION TEMPERATURES;
GRAIN SIZE;
INITIAL STAGES;
ORIENTATION IMAGING MICROSCOPY;
POWER FACTORS;
RAPIDLY SOLIDIFIED;
STACKED FOILS;
TEXTURE CHARACTERISTICS;
THERMOELECTRIC MATERIAL;
THERMOELECTRIC PROPERTIES;
TWIN BOUNDARIES;
Z VALUE;
ARGON;
BISMUTH;
BISMUTH COMPOUNDS;
CARRIER MOBILITY;
ELECTRIC POWER FACTOR;
GRAIN SIZE AND SHAPE;
RAPID SOLIDIFICATION;
SHEAR STRAIN;
TELLURIUM COMPOUNDS;
TEXTURES;
THERMOELECTRIC EQUIPMENT;
THERMOELECTRICITY;
EXTRUSION;
|
|
EID: 78649368381
PISSN: 13459678
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans.M2010065 Document Type: Article |
|
Times cited : (19)
|
|
References (14)
|
