A compact local binary pattern using maximization of mutual information for face analysis

Pattern Recognition

Volumn 44, Issue 3, 2011, Pages 532-543

  Jun, Bongjin ^a   Kim, Taewan ^a   Kim, Daijin ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Compact LBP; Face recognition; Facial expression recognition; Feature selection; Local binary pattern; Maximization of mutual information

Indexed keywords

COMPACT LBP; FACIAL EXPRESSION RECOGNITION; FEATURE SELECTION; LOCAL BINARY PATTERNS; MUTUAL INFORMATIONS;

FEATURE EXTRACTION; GESTURE RECOGNITION; INFORMATION USE; OPTIMIZATION;

FACE RECOGNITION;

EID: 78649318695     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2010.10.008     Document Type: Article

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