Spin-resolved photoemission microscopy and magnetic imaging in applied magnetic fields

Surface and Interface Analysis

Volumn 42, Issue 10-11, 2010, Pages 1532-1536

  Kronast, F ^a   Schlichting, J ^a   Radu, F ^a   Mishra, S K ^a   Noll, T ^a   Durr H A ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Photoelectron microscopy; Spin polarization; Thin film magnetism

Indexed keywords

APPLIED FIELD; APPLIED MAGNETIC FIELDS; BEAM LINES; EXPERIMENTAL FACILITIES; LENGTH SCALE; MAGNETIC IMAGING; MAGNETIC SWITCHING; PHOTOELECTRON MICROSCOPY; PHOTOEMISSION ELECTRON MICROSCOPE; PHOTOEMISSION MICROSCOPY; THIN FILM MAGNETISM; X-RAY POLARIZATIONS;

MAGNETIC FIELDS; MAGNETIC PROPERTIES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTONS; SPIN DYNAMICS; SPIN POLARIZATION; THIN FILMS;

ELECTRONS;

EID: 78449313135     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3561     Document Type: Conference Paper

References (16)

1. E. Bauer, J. Electron Spectrosc. Relat. Phenom. 2001, 975, 114.
2. C. M. Schneider, G. Schönhense, Rep. Prog. Phys. 2002, 65, 1785.
3. R. Fink, M. R. Weiss, E. Umbach, D. Preikszas, H. Rose, R. Spehr, P. Hartel, W. Engel, R. Degenhardt, R. Wichtendahl, H. Kuhlenbeck, W. Erlebach, K. Ihmann, R. Schlögl, H.-J. Freund, A. M. Bradshaw, G. Lilienkamp, Th. Schmidt, E. Bauer, G. Benner, J. Electron Spectrosc. Relat. Phenom. 1997, 84, 231.
4. F. Nolting, A. Scholl, J. Stöhr, J. Fompeyrine, H. Siegwart, J.-P. Locquet, S. Anders, J. Lüning, E. E. Fullerton, M. F. Toney, M. R. Scheinfein, H. A. Padmore, Nature 2000, 405, 767.
5. H. Ohldag, A. Scholl, F. Nolting, S. Anders, F. U. Hillebrecht, J. Stöhr, Phys. Rev. Lett. 2001, 86, 2878.
6. S.-B- Choe, Y. Acremann, A. Scholl, A. Bauer, A. Doran, J. Stöhr, H. Padmore, Science 2004, 304, 420.
7. V. N. Petrov, V. V. Grebenshikov, B. D. Grachev, A. S. Komochkin, Rev. Sci. Instrum. 2003, 74, 1278.
8. B. Sinkovic, L. H. Tjeng, N. B. Brookes, J. B. Goedkoop, R. Hesper, E. Pellegrin, F. M. F. de Groot, S. Altieri, S. L. Hulbert, E. Shekel, G. A. Sawatzky, Phys. Rev. Lett. 1997, 79, 3510.
9. G. Ghiringhelli, K. Larsson, N. B. Brookes, Rev. Sci. Instrum. 1999, 70, 4225.
10. B. Balke, G. H. Fecher, H. C. Kandpal, C. Felser, K. Kobayashi, E. Ikenaga, J.-J. Kim, S. Ueda, Phys. Rev. B. 2007, 74, 104405.
11. A. Gloskovskii, J. Barth, B. Balke, G. H. Fecher, C. Felser, F. Kronast, R. Ovsyannikov, H. A. Dürr, W. Eberhard, G. Schönhense, J. Phys. D: Appl. Phys. 2007, 40, 1570.
12. W. H. Meiklejohn, C. P. Bean, Phys. Rev. 1956, 102, 1413.
13. G. A. Prinz, Science 1998, 282, 1660.
14. F. Radu, A. Westphalen, K. Theis-Bröhl, H. Zabel, J. Phys.: Condens. Matter 2006, 18, 29.
15. F. Kronast, R. Ovsyannikov, A. Kaiser, C. Wiemann, S.-H. Yang, A. Locatelli, D. E. Bürgler, R. Schreiber, F. Salmassi, P. Fischer, H. A. Dürr, C. M. Schneider, W. Eberhardt, C. S. Fadley, Appl. Phys. Lett. 2008, 93, 243116.
16. B. Heitkamp, F. Kronast, L. Heyne, H. A. Dürr, W. Eberhardt, S. Landis, B. Rodmacq, J. Phys. D 2008, 41, 164002.