Ultra-high performance multi-turn TOF-SIMS system with a femto-second laser for post-ionization: Investigation of the performance in linear mode

Surface and Interface Analysis

Volumn 42, Issue 10-11, 2010, Pages 1598-1602

  Ishihara, Morio ^a   Ebata, Shingo ^a   Kumondai, Kousuke ^a   Mibuka, Ryo ^b   Uchino, Kiichiro ^b   Yurimoto, Hisayoshi ^c  

^a OSAKA UNIVERSITY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Femtsecond Laser; Ga FIB; Imaging; Laser Postionization; Matrix Effect; TOF SIMS

Indexed keywords

FEMTSECOND LASER; GA-FIB; IMAGING; LASER POSTIONIZATION; MATRIX EFFECTS; TOF SIMS;

PULSED LASER APPLICATIONS;

SECONDARY ION MASS SPECTROMETRY;

EID: 78449288519     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3611     Document Type: Conference Paper

References (7)

1. A. Fujiwara, J. Kawaguchi, D. K. Yeomans, M. Abe, T. Mukai, T. Okada, J. Saito, H. Yano, M. Yoshikawa, D. J. Scheeres, O. Barnouin-Jha, A. F. Cheng, H. Demura, R. W. Gaskell, N. Hirata, H. Ikeda, T. Kominato, H. Miyamoto, A. M. Nakamura, R. Nakamura, S. Sasaki, K. Uesugi, Science 2006, 312, 1330.
2. D. S. Burnett, Science 2006, 314, 1709-1710.
3. D. Okumura, M. Toyoda, M. Ishihara, I. Katakuse, Eur. J. Mass. Spectrum. 2005, 11, 261.
4. R. Mibuka, S. Hassaballa, K. Uchino, H. Yurimoto, R. Todokoro, K. Kumondai, M. Ishihara, Applied Surface Science 2008, 255, 1595.
5. A. Benninghoven, Surf. Sci. 1973, 35, 427.
6. H. Storms, Anal. Chem. 1977, 49, 2023.
7. T. Sakamoto, M. Koizumi, J. Kawasaki, J. Yamaguchi, Applied Surface Science 2008, 255, 1617.