High-resolution time-of-flight spectra obtained using the MULTUM II multi-turn type time-of-flight mass spectrometer with an electron ionization ion source

European Journal of Mass Spectrometry

Volumn 11, Issue 3, 2005, Pages 261-266

  Okumura, Daisuke ^a   Toyoda, Michisato ^a   Ishihara, Morio ^a   Katakuse, Itsuo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Electron ionization; High resolution; Multi turn time of flight mass spectrometer

Indexed keywords

EID: 24144475500     PISSN: 14690667     EISSN: None     Source Type: Journal    
DOI: 10.1255/ejms.727     Document Type: Article

References (11)

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