Quantitative strain analysis and growth mode of pulsed laser deposited epitaxial CoFe2O4 thin films

Acta Materialia

Volumn 59, Issue 2, 2011, Pages 514-520

  Axelsson, Anna Karin ^a   Aguesse, Frederic ^a   Spillane, Liam ^a   Valant, Matjaz ^b   McComb, David W ^a   Alford, Neil McN ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF NOVA GORICA   (Slovenia)

Author keywords

Cobalt ferrite; Interfaces; Pulsed laser deposition; Strain; Thin film

Indexed keywords

COBALT FERRITES; CRITICAL LAYER; CRYSTALLOGRAPHIC DIRECTIONS; GROWTH MODES; INTERFACES; ISLAND GROWTH; LATTICE STRAIN; LAYER-BY-LAYER GROWTH; MASS DIFFUSION; MICRO-STRAIN; MICROSCOPIC MECHANISMS; MICROSTRUCTURAL INVESTIGATION; MISMATCH COMPENSATION; POST ANNEALING; PULSED LASER; SRTIO; STRAIN ANALYSIS; STRANSKI-KRASTANOV GROWTH MODE;

ATOMIC FORCE MICROSCOPY; COBALT; DEPOSITION; EDGE DISLOCATIONS; FERRITE; FERRITES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PULSED LASER DEPOSITION; PULSED LASERS; SINGLE CRYSTALS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

FILM GROWTH;

EID: 78449243777     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.09.052     Document Type: Article

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