Strain influence on crystallography of AgNbO3 - Based thin films

Journal of Optoelectronics and Advanced Materials

Volumn 9, Issue 5, 2007, Pages 1377-1381

  Valant, Matjaz ^a   Axelsson, Anna Karin ^a   Zou, Bin ^a   Alford, Neil ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

AgNbO3; Crystallographic properties; Pulsed laser deposition; Thin films

Indexed keywords

ALUMINUM COMPOUNDS; LANTHANUM COMPOUNDS; LITHIUM COMPOUNDS; NIOBIUM COMPOUNDS; PULSED LASER DEPOSITION; SEMICONDUCTOR DOPING; SILVER COMPOUNDS; SINGLE CRYSTALS;

AGNBO3; CRYSTALLOGRAPHIC ANALYSIS; CRYSTALLOGRAPHIC PROPERTIES; EPITAXIAL RELATIONSHIPS; IN-PLANE DIRECTION; SINGLE CRYSTAL SUBSTRATES; STRESS-INDUCED; STRUCTURAL DEFECT;

THIN FILMS;

EID: 38549083263     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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