A combined synthetic & X chart for monitoring the process mean

International Journal of Production Research

Volumn 48, Issue 24, 2010, Pages 7423-7436

  Wu, Zhang ^a   Ou, Yanjing ^a   Castagliola, Philippe ^b   Khoo, Michael B C ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUT DE RECHERCHE EN COMMUNICATIONS ET CYBERNÉTIQUE DE NANTES   (France)

^c SCHOOL OF PHYSICS   (Malaysia)

Author keywords

conforming run length; quadratic loss function; quality control; statistical process control; synthetic control chart

Indexed keywords

CONFORMING RUN LENGTH; MANUFACTURING PROCESS; MEAN SHIFT; MEAN VALUES; PERFORMANCE STUDY; PROCESS MEAN; PRODUCTION LINE; QUADRATIC LOSS FUNCTIONS; QUALITY CHARACTERISTIC; SAMPLE MEANS; SHEWHART; STATISTICAL PROCESS; SYNTHETIC CONTROL CHART; TIME INTERVAL; X-CHARTS;

FLOWCHARTING; QUALITY CONTROL; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; VECTOR QUANTIZATION;

STATISTICAL PROCESS CONTROL;

EID: 78349273111     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540903496681     Document Type: Article

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