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Materials Science and Engineering: B

Volumn 94, Issue 1, 2002, Pages 40-47

Effect of microstructural features on the electrical properties of TiO2

(3) Song, S H a Wang, X a Xiao, P a,b

a BRUNEL UNIVERSITY (United Kingdom)

b UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

Electrical properties; Microstructural features; TiO2

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; IONIC CONDUCTION; MICROPOROSITY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINTERING; SPECTROSCOPIC ANALYSIS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

MICROSTRUCTURAL FEATURES;

TITANIUM DIOXIDE;

EID: 0037097052 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(02)00072-7 Document Type: Article

Times cited : (64)

References (28)

1
- 0004199420
- Butterworths, London
- (1967) Oxidation of Metals and Alloys, second ed.
- Kubaschewski, O.¹ Hopkins, B.E.²

2
- 0003865062
- Edward Arnold, London
- (1983) Introduction to High Temperature Oxidation of Metals
- Birks, N.¹ Meier, G.H.²

3
- 0004031650
- Chapman and Hall, London
- (1990) Electroceramics
- Moulson, A.J.¹ Herbert, J.M.²

4
- 0003678496
- VCH, Weinheim, Germany
- (1994) Materials Science and Technology, vol. 11, Structure and Properties of Ceramics , vol.11
- Swain, M.V.¹

5
- 0006132957
- (1981) J. Mater. Sci. , vol.16 , pp. 2003
- Franken, P.E.C.¹ Viegers, M.P.A.²

6
- 0001728934
- (1982) J. Mater. Sci. , vol.17 , pp. 3510
- Burn, I.¹ Neirman, S.²

7
- 0006031508
- (1995) Nature , vol.377 , pp. 290
- Ball, P.¹

8
- 0028257003
- (1994) J. Mater. Sci. Lett. , vol.13 , pp. 59
- Kumar, K.N.P.¹ Keizer, K.² Burggraf, A.J.³

9
- 0012689732
- (1993) J. Phys. Chem. , vol.97 , pp. 12651
- Dagan, G.¹ Tomkiewiez, M.²

10
- 0001064161
- (1985) J. Phys. Chem. , vol.89 , pp. 4418
- Fan, F.F.¹ Liu, H.Y.² Brad, A.J.³

11
- 84985153829
- (1992) J. Am. Ceram. Soc. , vol.75 , pp. 546
- Cantalini, C.¹ Pelino, M.²

12
- 0027271202
- (1993) Br. Ceram. Trans. , vol.92 , pp. 104
- Gusmano, G.¹ Montesperelli, G.² Nunziante, P.³ Traversa, E.⁴

13
- 0346623210
- (1979) Russ. Solid State Phys. , vol.21 , pp. 383
- Popov, V.P.¹ Svaiko-Svaikovski, V.E.² Andreev, A.A.³

14
- 36149017063
- (1952) Phys. Rev. , vol.87 , pp. 876
- Cronemeyer, D.C.¹

15
- 0017455688
- (1977) Phys. Sta. Sol. A , vol.39 , pp. 373
- Baumard, J.F.¹ Tani, E.²

16
- 0006061742
- (1985) C.R. Acad. Sci. Paris , vol.301 , pp. 679
- Carpentier, J.L.¹ Lebrun, A.² Perdu, F.³ Tellier, P.⁴

17
- 0006031353
- (1987) C.R. Acad. Sci. Paris , vol.304 , pp. 1489
- Carpentier, J.L.¹ Lebrun, A.² Perdu, F.³ Tellier, P.⁴

18
- 0003792371
- Wiley, Chichester, UK
- (1987) Impedance Spectroscopy
- MacDonald, J.R.¹

19
- 0003758574
- Wiley, New York, USA
- (1967) High-Temperature Materials and Technology
- Campbell, I.E.¹ Sherwood, E.M.²

20
- 0004177869
- IFI/Plenum, London, UK
- (1973) The Oxide Handbook
- Samsonov, G.V.¹

21
- 0029360296
- (1995) J. Electrochem. Soc. , vol.142 , pp. 2650
- Fletcher, J.G.¹ West, A.R.² Irvine, J.T.S.³

22
- 0003192808
- (1999) Corrosion , vol.55 , pp. 17
- Amaral, S.T.¹ Muller, I.L.²

23
- 0004141984
- Interfacial electrochemistry
- P.G. Bruce (Ed.) Cambridge University Press
- (1995) Solid State Electrochemistry
- Armstrong, R.D.¹ Todd, M.²

24
- 0035297475
- (2001) J. Am. Ceram. Soc. , vol.84 , pp. 521
- Rodewald, S.¹ Fleig, J.² Maier, J.³

25
- 0001197357
- (1999) J. Appl. Phys. , vol.85 , pp. 897
- Knauth, P.¹ Tuller, H.L.²

26
- 0033514786
- (1999) Solid State Ionics , vol.118 , pp. 271
- Demetry, C.¹ Shi, V.²

27
- 34547248551
- (1969) J. Phys. Chem. Solids , vol.30 , pp. 2657
- Bauerle, J.E.¹

28
- 0032099065
- (1998) J. Electrochem. Soc. , vol.145 , pp. 2081
- Fleig, J.¹ Maier, J.²

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