Mechanical vs. electrical failure mechanisms in high voltage, high energy density multilayer ceramic capacitors

Journal of Materials Science

Volumn 42, Issue 14, 2007, Pages 5613-5619

  Young, Amanda Lynn ^a   Hilmas, Gregory E ^a   Zhang, Shi C ^a   Schwartz, Robert W ^a  

^a Architectural and Environmental Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; BENDING STRENGTH; CERAMIC CAPACITORS; CORRELATION METHODS; CURRENT DENSITY; ELECTRIC BREAKDOWN; WEIBULL DISTRIBUTION;

ELECTRODE LAYERS; HIGH ENERGY DENSITY; WEIBULL STATISTICS;

FAILURE ANALYSIS;

EID: 34547291885     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-1116-2     Document Type: Article

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