Chromatic second harmonic imaging

Optics Express

Volumn 18, Issue 23, 2010, Pages 23837-23843

  Yang, Chuan ^a   Shi, Kebin ^a   Li, Haifeng ^a   Xu, Qian ^a   Gopalan, Venkatraman ^b   Liu, Zhiwen ^a  

^a The Center for Nanotechnology Education and Utilization   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC ANALYSIS; IMAGING TECHNIQUES; LENSES;

AXIAL POSITIONS; AXIAL SCANNING; CENTER WAVELENGTH; CHROMATIC ABERRATION; FRESNEL LENS; FUNDAMENTAL WAVELENGTH; MECHANICAL SCANNING; PROOF OF CONCEPT; SECOND HARMONIC SIGNALS; SECOND-HARMONIC IMAGING;

SCANNING;

EID: 78149461491     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.023837     Document Type: Article

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