Development and application of setup for ac magnetic field in neutron scattering experiments

Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

  Klimko, Sergey ^a   Zhernenkov, Kirill ^b,c   Toperverg, Boris P ^b,d   Zabel, Hartmut ^b  

^a LABORATOIRE LÉON BRILLOUIN   (France)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

^d PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AC FIELD; AC MAGNETIC FIELDS; ALTERNATING MAGNETIC FIELD; IRON FILM; NEUTRON SCATTERING EXPERIMENTS; POLARIZED NEUTRON REFLECTOMETRY; RE MAGNETIZATIONS; RESONANCE CIRCUITS; RF GENERATORS; SAMPLE POSITION; SOFT FERROMAGNETIC; WIDE-BAND;

CRITICAL CURRENTS; EXPERIMENTS; FERROMAGNETIC MATERIALS; MAGNETIC FIELDS; NEUTRON SCATTERING; NEUTRONS;

AC GENERATOR MOTORS;

EID: 78149450644     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3495965     Document Type: Conference Paper

References (39)

1. R. Gähler, R. Golub, and T. Keller, Physica B PHYBE3 0921-4526 180-181, 899 (1992). 10.1016/0921-4526(92)90503-K
2. M. Bleuel, F. Demmel, R. Gähler, R. Golub, K. Habicht, T. Keller, S. Klimko, I. Köper, S. Longeville, and S. Prokudaylo, Lecture Notes in Physics 601 (Springer Verlag, Berlin, 2003).
3. R. Golub and R. Gähler, Phys. Lett. A PYLAAG 0375-9601 123, 43 (1987). 10.1016/0375-9601(87)90760-2
4. R. Gähler and R. Golub, Z. Phys. B: Condens. Matter ZPCMDN 0722-3277 65, 269 (1987). 10.1007/BF01303712
5. T. Keller, R. Golub, F. Mezei, and R. Gähler, Physica B PHYBE3 0921-4526 234-236, 1126 (1997). 10.1016/S0921-4526(97)00131-2
6. S. Longeville, J. Phys. IV JPICEI 1155-4339 10, Pr1-59 (2000). 10.1051/jp4:2000105
7. S. Klimko, C. Stadler, P. Böni, R. Currat, F. Demmel, B. Fk, R. Gähler, F. Mezei, and B. Toperverg, Physica B PHYBE3 0921-4526 335, 188 (2003). 10.1016/S0921-4526(03)00234-5
8. W. Häussler, D. Streibl, and P. Böni, Meas. Sci. Technol. MSTCEP 0957-0233 19, 034015 (2008). 10.1088/0957-0233/19/3/034015
9. T. Keller, K. Habicht, H. Klann, M. Ohl, H. Schneider, and B. Keimer, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 74, s332 (2002). 10.1007/s003390201612
10. M. Jernenkov, H. Lauter, V. Lauter-Pasyuk, B. Toperverg, S. Klimko, and R. Gähler, Physica B PHYBE3 0921-4526 357, 94 (2005). 10.1016/j.physb.2004. 11.029
11. J. Major, H. Dosch, G. P. Felcher, K. Habicht, T. Keller, S. G. E. te Velthuis, A. Vorobiev, and M. Wahl, Physica B PHYBE3 0921-4526 336, 8 (2003). 10.1016/S0921-4526(03)00264-3
12. R. Georgii, P. Böni, M. Janoschek, C. Schatzer, and S. Valloppilly, Physica B PHYBE3 0921-4526 397, 150 (2007). 10.1016/j.physb.2007.02.088
13. T. A. Moore and J. A. C. Bland, J. Phys.: Condens. Matter JCOMEL 0953-8984 16, R1369 (2004). 10.1088/0953-8984/16/46/R03
14. S. S. P. Parkin, M. Hayashi, and L. Thomaset, Science SCIEAS 0036-8075 320, 190 (2008). 10.1126/science.1145799
15. M. Wolff, K. Zhernenkov, and H. Zabel, Thin Solid Films THSFAP 0040-6090 515, 5712 (2007). 10.1016/j.tsf.2006.12.025
16. H. Zabel, K. Theis-Bröhl, and B. P. Toperverg, in Handbook of Magnetism and Advanced Magnetic Materials, edited by, H. Kronmüller, and, S. Parkin, (Wiley, New York, 2007), Vol. 12, p. 1237.
17. H. Zabel, K. Theis-Bröhl, M. Wolff, and B. P. Toperverg, IEEE Trans. Magn. IEMGAQ 0018-9464 44, 1928 (2008). 10.1109/TMAG.2008.924538
18. A. Hubert and R. Schäfer, Magnetic Domains. The Analysis of Magnetic Microstructures (Springer, Berlin, 1998).
19. K. Zhernenkov, S. Klimko, B. P. Toperverg, and H. Zabel, J. Phys.: Conf. Ser. JPCSDZ 1742-6588 211, 012016 (2010). 10.1088/1742-6596/211/1/012016
20. S. Couet, K. Schlage, Th. Diederich, R. Rüffer, K. Theis-Bröhl, B. P. Toperverg, K. Zhernenkov, H. Zabel, and R. Röhlsberger, New J. Phys. NJOPFM 1367-2630 11, 013038 (2009). 10.1088/1367-2630/11/1/013038
21. K. Theis-Bröhl, A. Westphalen, H. Zabel, U. Rücker, J. McCord, V. Höink, J. Schmalhorst, G. Reiss, T. Weis, D. Engel, A. Ehresmann, and B. P. Toperverg, New J. Phys. NJOPFM 1367-2630 10, 093021 (2008). 10.1088/1367-2630/10/9/093021
22. C. Hamann, J. McCord, L. Schultz, B. P. Toperverg, K. Theis-Bröhl, M. Wolff, R. Kaltofen, and I. Mönch, Phys. Rev. B PLRBAQ 0556-2805 81, 024420 (2010). 10.1103/PhysRevB.81.024420
23. See http://www.home.agilent.com for Agilent Technologies.
24. See http://www.tcpowerconversion.com/ag/ag1010.html for T&C Power Conversion Inc.
25. S. Klimko, " ZETA, A zero field spin echo method for very high resolution study of elementary excitations and first application.," Ph.D. thesis, TU Berlin, 2003.
26. K. Thillosen, private communication.
27. See https://www.amidoncorp.com/ for Amidon Inc.
28. C. A. Ross, R. Chantrell, M. Hwang, M. Farhoud, T. A. Savas, Y. Hao, H. I. Smith, F. M. Ross, M. Redjdal, and F. B. Humphrey, Phys. Rev. B PLRBAQ 0556-2805 62, 14252 (2000). 10.1103/PhysRevB.62.14252
29. P. -B. He and W. M. Liu, Phys. Rev. B PLRBAQ 0556-2805 72, 064410 (2005). 10.1103/PhysRevB.72.064410
30. A. Yamaguchi, T. Ono, S. Nasu, K. Miyake, K. Mibu, and T. Shinjo, Phys. Rev. Lett. PRLTAO 0031-9007 92, 077205 (2004). 10.1103/PhysRevLett.92.077205
31. n is its magnetic moment.
32. B. Toperverg, O. Nikonov, V. Lauter-Pasyuk, and H. J. Lauter, Physica B PHYBE3 0921-4526 297, 169 (2001). 10.1016/S0921-4526(00)00866-8
33. H. Lauter, V. Lauter, A. Vorobiev, M. Mylaev, L. Romashev, V. Ustinov, and B. Toperverg, Physica B PHYBE3 0921-4526 404, 2553 (2009). 10.1016/j.physb.2009.06.131
34. The positions of the critical edges on specular ridges at f=1.8 MHz are close to those in saturation fixed with the bias field of 25 Oe.
35. Actually, scattered intensity is a result of a two stage averaging process (Ref.). Firstly, the scattering length density (SLD) is averaged over the lateral cross section of the coherence volume, i.e., over the coherence ellipsoid, which at grazing incidence is strongly anisotropic. Its long axis, referred to as the coherence length, is directed along the x -axis. In the second stage, the scattered intensity is incoherently averaged over a number of different coherence ellipsoids covering the sample surface.
36. b =25 Oe without ac field.
37. T. Shinjo, T. Okuno, R. Hassdorf, K. Shigeto, and T. Ono, Science SCIEAS 0036-8075 289, 930 (2000). 10.1126/science.289.5481.930
38. C. Nistor, G. S. D. Beach, and J. L. ErskineC, Rev. Sci. Instrum. RSINAK 0034-6748 77, 103901 (2006). 10.1063/1.2356856
39. T. Ono, H. Miyajima, K. Shigeto, K. Mibu, N. Hosoito, and T. Shinjo, Science SCIEAS 0036-8075 284, 468 (1999). 10.1126/science.284.5413.468