Polarized neutron reflectometry for the analysis of nanomagnetic systems

IEEE Transactions on Magnetics

Volumn 44, Issue 7, 2008, Pages 1928-1934

  Zabel, H ^a   Theis Brohl K ^a   Wolff, M ^a   Toperverg, B P ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Lateral magnetic patterns; Magnetic multilayers; Magnetic nanostructure; Magnetization reversal; Polarized neutron reflectometry

Indexed keywords

BORN APPROXIMATION; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC DOMAINS; MAGNETIC SEMICONDUCTORS; MAGNETIZATION REVERSAL; NEUTRON REFLECTION; NEUTRON SCATTERING; REFLECTION; REFLECTOMETERS;

DISTORTED WAVE BORN APPROXIMATION; FERROMAGNETIC AND ANTI-FERROMAGNETIC; FERROMAGNETIC HEUSLER ALLOY; MAGNETIC NANOSTRUCTURES; MAGNETIC PATTERNS; MAGNETIZATION FLUCTUATIONS; POLARIZED NEUTRON REFLECTOMETRY; X-RAY RESONANT MAGNETIC SCATTERING;

MAGNETIC MULTILAYERS;

EID: 45849143290     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.924538     Document Type: Article

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