High pressure stability of bismuth sillenite: A Raman spectroscopic and x-ray diffraction study

Journal of Applied Physics

Volumn 108, Issue 8, 2010, Pages

  Rao, Rekha ^a   Garg, Alka B ^a   Sakuntala, T ^b  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b DEPARTMENT OF ATOMIC ENERGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT PRESSURES; BULK MODULUS; CUBIC STRUCTURE; DYNAMIC INSTABILITY; HIGH PRESSURE; HIGH-PRESSURE BEHAVIOR; IN-SITU; NEGATIVE PRESSURES; ORTHOSILICATE; PRESSURE DERIVATIVES; PRESSURE-INDUCED AMORPHIZATION; RAMAN ACTIVE MODES; RAMAN MODES; RAMAN SPECTROSCOPIC; SILLENITES; STRUCTURAL STUDIES; X-RAY DIFFRACTION STUDIES; X-RAY DIFFRACTION TECHNIQUES;

BISMUTH; DIFFRACTION; RAMAN SPECTROSCOPY; SILICON; SILICON COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BISMUTH COMPOUNDS;

EID: 78149447907     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3496659     Document Type: Article

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