A high-pressure Raman spectroscopic study of hafnon, HfSiO4

American Mineralogist

Volumn 91, Issue 11-12, 2006, Pages 1888-1892

  Manoun, Bouchaib ^a   Downs, Robert T ^b   Saxena, Surendra K ^a  

^a FLORIDA INTERNATIONAL UNIVERSITY   (United States)

^b University of Arizona   (United States)

Author keywords

Hafnon; Phase transformation; Raman spectroscopy; Scheelite structured HfSiO4

Indexed keywords

INCOMPRESSIBLE FLOW; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SILICATE MINERALS; SILICON; SPECTROSCOPIC ANALYSIS; TUNGSTATE MINERALS; ZIRCON;

AMBIENT CONDITIONS; HAFNON; HIGH PRESSURE RAMAN; PEAK POSITION; PRESSURE DERIVATIVES; SCHEELITE STRUCTURE; SCHEELITE-STRUCTURED HFSIO4; TEMPERATURE PHASE;

HAFNIUM COMPOUNDS;

COMPRESSIBILITY; HIGH PRESSURE; PHASE TRANSITION; RAMAN SPECTROSCOPY; SCHEELITE; SILICATE MINERAL;

EID: 33845258556     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2006.2070     Document Type: Article

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