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Materials Science Forum

Volumn 615 617, Issue , 2009, Pages 493-496

Atomistic scale modeling and analysis of sodium enhanced oxidation of silicon carbide

(2) Chatterjee, Aveek a Matocha, Kevin a

a GE GLOBAL RESEARCH (United States)

Author keywords

Atomistic scale modeling; Density functional theory; Sodium enhanced oxidation

Indexed keywords

CARBON CLUSTERS; COMPUTATION THEORY; CRYSTAL ATOMIC STRUCTURE; DENSITY FUNCTIONAL THEORY; ELECTRIC FIELDS; OXIDATION; SILICON CARBIDE; SILICON OXIDES;

ATOMISTIC SCALE; COMPUTATIONAL TECHNIQUE; DEFECT FORMATION; ELECTRIC FIELD COMPUTATION; INTERFACE TRAPS; INVERSION CHANNELS; OXIDATION RATES; SODIUM ENHANCED OXIDATIONS;

SODIUM COMPOUNDS;

EID: 78149437712 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.615-617.493 Document Type: Conference Paper

Times cited : (2)

References (9)

1
- 36949009801
- doi:10.4028/www.scientific.net/MSF.556-557.487
- E. Sveinbjornsson, F. Allerstam, H. Olafsson, G. Gudjonsson, D. Dochev, T. Rodle, and R. Jos: Mater. Sci. Forum Vol. 556-557 (2007), p. 487 doi:10.4028/www.scientific.net/MSF.556-557.487.
- (2007) Mater. Sci. Forum , vol.556-557 , pp. 487
- Sveinbjornsson, E.¹ Allerstam, F.² Olafsson, H.³ Gudjonsson, G.⁴ Dochev, D.⁵ Rodle, T.⁶ Jos, R.⁷

2
- 38449094661
- doi:10.4028/www.scientific.net/MSF.556-557.517
- F. Allerstam, G. Gudjonsson, E. Sveinbjornsson, T. Rodle, and R. Jos: Mater. Sci. Forum, Vol. 556-557 (2007), p. 516 doi:10.4028/www.scientific.net/ MSF.556-557.517.
- (2007) Mater. Sci. Forum , vol.556-557 , pp. 516
- Allerstam, F.¹ Gudjonsson, G.² Sveinbjornsson, E.³ Rodle, T.⁴ Jos, R.⁵

3
- 13444312074
- High field-effect mobility in n-channel Si Face 4H-SiC MOSFETs with gate oxide grown on aluminum ion-implanted material
- DOI 10.1109/LED.2004.841191
- G. Gudjonsson, H. Olafsson, F. Allerstam, P. Nilsson, E. Sveinbjornsson, H. Zirath, T. Rodle, and R. Jos: IEEE Electron Dev. Lett. Vol. 26 (2005), p. 96 doi:10.1109/LED.2004.841191. (Pubitemid 40210951)
- (2005) IEEE Electron Device Letters , vol.26 , Issue.2 , pp. 96-98
- Gudjonsson, G.¹ Olafsson, H.O.² Allerstam, F.³ Nilsson, P.A.⁴ Sveinbjornsson, E.O.⁵ Zirath, H.⁶ Rodle, T.⁷ Jos, R.⁸

4
- 2442537377
- doi:10.1103/PhysRevB.54.11169
- G. Kresse and J. Furthmüller: Physical Review B, Vol. 54 (1996), p. 11169 doi:10.1103/PhysRevB.54.11169.
- (1996) Physical Review B , vol.54 , pp. 11169
- Kresse, G.¹ Furthmüller, J.²

5
- 0011236321
- doi:10.1103/PhysRevB.59.1758
- G. Kresse and J. Joubert: Physical Review B, Vol. 59 (1999), p. 1758 doi:10.1103/PhysRevB.59.1758.
- (1999) Physical Review B , vol.59 , pp. 1758
- Kresse, G.¹ Joubert, J.²

6
- 36148971816
- Release 4.1, Accelrys Software, Inc. San Diego
- Accelrys: Materials Studio Release Notes, Release 4.1, Accelrys Software, Inc., San Diego, 2006.
- (2006) Materials Studio Release Notes
- Accelrys¹

7
- 19844364631
- 2 interface
- DOI 10.1016/j.mee.2005.04.021, PII S0167931705001590, 14th Biennial Conference on Insulating Films on Semiconductors
- F. Devynck, F. Giustino, and A. Pasquarello: Microelectronic Eng., Vol. 80 (2005), p. 38 doi:10.1016/j.mee.2005.04.021. (Pubitemid 40761066)
- (2005) Microelectronic Engineering , vol.80 , Issue.SUPPL. , pp. 38-41
- Devynck, F.¹ Giustino, F.² Pasquarello, A.³

8
- 79251543495
- submitted to
- A. Gavrikov, A. Knizhnik, A. Safonov, A. Schrebinin, A. Bagatur'yants, B. Potapkin, A. Chatterjee, and K. Matocha: submitted to Journal of Applied Physics (2008).
- (2008) Journal of Applied Physics
- Gavrikov, A.¹ Knizhnik, A.² Safonov, A.³ Schrebinin, A.⁴ Bagatur'yants, A.⁵ Potapkin, B.⁶ Chatterjee, A.⁷ Matocha, K.⁸

9
- 0003628235
- Plenum Press, New York
- R. Dreizler, and E. Gross: Density Functional Theory (Plenum Press, New York, 1995).
- (1995) Density Functional Theory
- Dreizler, R.¹ Gross, E.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.