Exact analytical solution for the critical layer thickness of a lattice-mismatched heteroepitaxial layer

Journal of Electronic Materials

Volumn 39, Issue 10, 2010, Pages 2248-2250

  Belgacem, C Hadj ^a   Fnaiech, M ^a  

^a FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

Author keywords

Analytical solution; Critical thickness; Defects; Growth models; Lambert W function

Indexed keywords

ANALYTICAL SOLUTIONS; CLOSED FORM; CRITICAL LAYER THICKNESS; CRITICAL THICKNESS; EXACT ANALYTICAL SOLUTIONS; GROWTH MODELS; HETEROEPITAXIAL LAYERS; ITERATIVE COMPUTATION; LAMBERT W FUNCTION; LATTICE-MISMATCHED; NUMERICAL SOLUTION;

DEFECTS;

SOLAR CELL ARRAYS;

EID: 78149409519     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1290-5     Document Type: Article

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