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Volumn 39, Issue 10, 2010, Pages 2248-2250

Exact analytical solution for the critical layer thickness of a lattice-mismatched heteroepitaxial layer

Author keywords

Analytical solution; Critical thickness; Defects; Growth models; Lambert W function

Indexed keywords

ANALYTICAL SOLUTIONS; CLOSED FORM; CRITICAL LAYER THICKNESS; CRITICAL THICKNESS; EXACT ANALYTICAL SOLUTIONS; GROWTH MODELS; HETEROEPITAXIAL LAYERS; ITERATIVE COMPUTATION; LAMBERT W FUNCTION; LATTICE-MISMATCHED; NUMERICAL SOLUTION;

EID: 78149409519     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1290-5     Document Type: Article
Times cited : (8)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.