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Volumn 39, Issue 10, 2010, Pages 2248-2250
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Exact analytical solution for the critical layer thickness of a lattice-mismatched heteroepitaxial layer
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Author keywords
Analytical solution; Critical thickness; Defects; Growth models; Lambert W function
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Indexed keywords
ANALYTICAL SOLUTIONS;
CLOSED FORM;
CRITICAL LAYER THICKNESS;
CRITICAL THICKNESS;
EXACT ANALYTICAL SOLUTIONS;
GROWTH MODELS;
HETEROEPITAXIAL LAYERS;
ITERATIVE COMPUTATION;
LAMBERT W FUNCTION;
LATTICE-MISMATCHED;
NUMERICAL SOLUTION;
DEFECTS;
SOLAR CELL ARRAYS;
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EID: 78149409519
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-010-1290-5 Document Type: Article |
Times cited : (8)
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References (16)
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