A novel silicon patch-clamp chip permits high-fidelity recording of ion channel activity from functionally defined neurons

Biotechnology and Bioengineering

Volumn 107, Issue 4, 2010, Pages 593-600

  Py, Christophe ^a   Denhoff, Mike W ^a   Martina, Marzia ^a   Monette, Robert ^a   Comas, Tanya ^a   Ahuja, Tarun ^a   Martinez, Dolores ^a   Wingar, Simon ^a   Caballero, Juan ^a   Laframboise, Sylvain ^a   Mielke, John ^a   Bogdanov, Alexei ^a   Luk, Collin ^b   Syed, Naweed ^b   Mealing, Geoff ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF CALGARY   (Canada)

Author keywords

Cultured neurons; Electrophysiological recordings; Low capacitance; Patch clamp; Silicon planar patch clamp chip; Whole cell recordings

Indexed keywords

CULTURED NEURONS; ELECTROPHYSIOLOGICAL RECORDINGS; LOW CAPACITANCE; PATCH-CLAMP; WHOLE-CELL RECORDINGS;

CAPACITANCE; CELL CULTURE; CELL MEMBRANES; ELECTROPHYSIOLOGY; IONS; PLASTICITY TESTING; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON NITRIDE; WET ETCHING;

SILICON WAFERS;

ION CHANNEL; SILICON; SILICON DIOXIDE; SILICON NITRIDE;

ACTION POTENTIAL; ARTICLE; CELL CULTURE; CELL MEMBRANE; ELECTRIC CAPACITANCE; ELECTROPHYSIOLOGY; FILM; IN VITRO STUDY; LYMNAEA; MEMBRANE DEPOLARIZATION; NERVE CELL; NERVE CELL PLASTICITY; NONHUMAN; PATCH CLAMP; VOLTAGE CLAMP; WHOLE CELL;

ANIMALS; BIOTECHNOLOGY; CELLS, CULTURED; DRUG EVALUATION, PRECLINICAL; ELECTRIC CAPACITANCE; ION CHANNELS; LYMNAEA; MEMBRANE POTENTIALS; NEURONS; PATCH-CLAMP TECHNIQUES; SILICON;

LYMNAEA;

EID: 78149351037     PISSN: 00063592     EISSN: 10970290     Source Type: Journal    
DOI: 10.1002/bit.22834     Document Type: Article

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