Quantification of multiple twinning in face centred cubic materials

Acta Materialia

Volumn 59, Issue 1, 2011, Pages 252-262

  Cayron, C ^a  

^a CEA GRENOBLE   (France)

Author keywords

Electron backscatter diffraction (EBSD); Grain boundary engineering (GBE); Recrystallization; Twin related domain; Twinning

Indexed keywords

COPPER THIN FILM; ELECTRON BACK SCATTER DIFFRACTION; FACE-CENTRED CUBIC; GRAIN BOUNDARY ENGINEERING; GRAIN BOUNDARY ENGINEERING (GBE); HIGH-CONTENT; LOW STACKING FAULT ENERGIES; NEW PARAMETERS; NICKEL SUPERALLOY; RECRYSTALLIZATIONS; SILICON INGOT; TWIN BOUNDARIES; TWIN RELATED DOMAIN;

BACKSCATTERING; CADMIUM; CADMIUM COMPOUNDS; CADMIUM TELLURIDE; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; RECRYSTALLIZATION (METALLURGY); SINGLE CRYSTALS; TREES (MATHEMATICS);

GRAIN SIZE AND SHAPE;

EID: 78049529923     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.09.029     Document Type: Article

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