Offset-frequency locking of extended-cavity diode lasers for precision spectroscopy of water at 1.38 μm

Optics Express

Volumn 18, Issue 21, 2010, Pages 21851-21860

  Castrillo, A ^a   Fasci, E ^a   Galzerano, G ^b   Casa, G ^a   Laporta, P ^b   Gianfrani, L ^a  

^a SECOND UNIVERSITY OF NAPLES   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; SEMICONDUCTOR LASERS; SPECTROMETRY;

CONTINUOUS-WAVE DIODE LASER; EXTENDED-CAVITY DIODE LASERS; FREQUENCY FLUCTUATION; INTEGRATION TIME; MASTER LASERS; MOLECULAR ABSORPTION; OFFSET FREQUENCIES; PRECISION SPECTROSCOPY; QUANTITATIVE SPECTROSCOPY; RELATIVE DEVIATIONS; REPRODUCIBILITIES; SLAVE LASER; SPECTROSCOPIC PARAMETERS; TIME INTERVAL;

SPECTROMETERS;

WATER;

ABSORPTION; ARTICLE; CHEMISTRY; DIODE LASER; ELECTRONICS; EQUIPMENT DESIGN; LASER; METHODOLOGY; SPECTROPHOTOMETRY; TIME;

ABSORPTION; ELECTRONICS; EQUIPMENT DESIGN; LASERS; LASERS, SEMICONDUCTOR; SPECTROPHOTOMETRY; TIME FACTORS; WATER;

EID: 78049507291     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.021851     Document Type: Article

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