Photoluminescence, FTIR and X-ray diffraction studies on undoped and Al-doped ZnO thin films grown on polycrystalline α-alumina substrates by ultrasonic spray pyrolysis

Journal of Luminescence

Volumn 130, Issue 11, 2010, Pages 2113-2117

  Djelloul, A ^a   Aida, M S ^b   Bougdira, J ^c  

^a ABBES LAGHROUR UNIVERSITY   (Algeria)

^b Universite Mentouri Constantine   (Algeria)

^c INSTITUT JEAN LAMOUR   (France)

Author keywords

Infrared spectroscopy; Oxygen vacancies; Photoluminescence; X ray diffraction; Zinc aluminate; Zinc oxide

Indexed keywords

AL SOURCES; AL-DOPED ZNO; ALUMINA SUBSTRATES; ALUMINUM CHLORIDES; ALUMINUM-DOPED ZINC OXIDE; FT-IR ABSORBANCE; FTIR; GREEN EMISSIONS; NON-STOICHIOMETRY; OXYGEN SUBLATTICES; POLYCRYSTALLINE; SEM; SPINEL LAYERS; SUBSTRATE TEMPERATURE; ULTRASONIC SPRAY PYROLYSIS; X-RAY DIFFRACTION STUDIES; ZINC ACETATE DIHYDRATE; ZINC ALUMINATE; ZNO; ZNO THIN FILM; ZNO:AL FILMS;

ALUMINUM; CHLORINE COMPOUNDS; DEIONIZED WATER; DIFFRACTION; ETHANOL; FOURIER TRANSFORMS; INFRARED SPECTROSCOPY; METALLIC FILMS; METHANOL; OPTICAL FILMS; ORGANOMETALLICS; OXIDE FILMS; OXYGEN; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; STOICHIOMETRY; SUBSTRATES; THIN FILMS; ULTRASONIC TESTING; ULTRASONICS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAYS; ZINC; ZINC OXIDE;

OXYGEN VACANCIES;

EID: 78049417725     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2010.06.002     Document Type: Article

References (20)

1. W.Y. Liang, and A.D. Yoffe Phys. Rev. Lett. 20 1968 59
2. I.V. Kityk, J. Ebothe, A. Elchichou, M. Addou, A. Bougrine, and B. Sahraoui Phys. Status Solidi B 234 2002 553
3. J.F. Chang, H.H. Kuo, I.C. Leu, and M.H. Hon Sens. Actuators B 84 2002 258
4. D. Song, A.G. Aberle, and J. Xia Appl. Surf. Sci. 195 2002 291
5. M. Chen, Z.L. Pei, C. Sun, J. Gong, R.F. Huang, and L.S. Wen Mater. Sci. Eng. B 85 2001 212
6. W. Jia, K. Monge, and F. Fernandez Opt. Mater. 23 2003 27
7. E.G. Bylander J. Appl. Phys. 49 1978 1188
8. K. Vanheusden, C.H. Seager, W.L. Warren, D.R. Tallant, J. Caruso, M.J. Hampden-Smith, and T.T. Kodas J. Lumin. 75 1997 11
9. M. Liu, A.H. Kitai, and P. Mascher J. Lumin. 54 1992 35
10. B. Lin, Z. Fu, and Y. Jia Appl. Phys. Lett. 79 2001 943
11. J.M. Calleja, and M. Cardona Phys. Rev. B 16 1977 3753
12. K. Bouzid, A. Djelloul, N. Bouzid, and J. Bougdira Phys. Status Solidi a 206 2009 106
13. H.C. Ong, A.X.E. Zhu, and G.T. Du Appl. Phys. Lett. 80 2002 941
14. B.D. Cullity Elements of X-Ray Diffraction 2nd ed. 1978 Addison-Wesley Reading, MA pp. 102
15. K. Vanheusden, W.L. Warren, C.H. Seager, D.R. Tallant, J.A. Voigt, and B.E. Gnade J. Appl. Phys. 79 1996 7983
16. M. Ghamnia, C. Jardin, and M. Bouslama J. Electron Spectrosc. Relat. Phenom. 133 2003 55
17. E.V. Lavrov, J. Weber, F. Brrnert, C.G. Van de Walle, and R. Helbig Phys. Rev. B 66 2002 165205
18. N.H. Nickel, and K. Fleischer Phys. Rev. Lett. 90 2003 197402
19. G.-C. Yi, and B.W. Wessels Appl. Phys. Lett. 70 1997 357
20. A.S. Barker Jr Phys. Rev. 132 1963 1474