Integrated importance measures of multi-state systems under uncertainty

Computers and Industrial Engineering

Volumn 59, Issue 4, 2010, Pages 921-928

  Si, Shubin ^a   Cai, Zhiqiang ^a   Sun, Shudong ^a   Zhang, Shenggui ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Bayesian network; Head up display; Integrated importance measure; Multi state system; Uncertainty

Indexed keywords

BAYESIAN INFORMATION CRITERION; COMPONENT FAILURES; COMPONENT IMPORTANCE; HEAD UP DISPLAYS; HEAD-UP DISPLAY SYSTEMS; IMPORTANCE ANALYSIS; IMPORTANCE MEASURE; INTEGRATED IMPORTANCE MEASURE; K2 ALGORITHM; MULTI-STATE SYSTEM; PRACTICAL SYSTEMS; RELIABILITY ENGINEERING; STATE DISTRIBUTIONS; STRUCTURE CHARACTERISTIC; SUBSET ALGORITHM; UNCERTAINTY;

ALGORITHMS; BAYESIAN NETWORKS; DISTRIBUTED PARAMETER NETWORKS; INFERENCE ENGINES; INTELLIGENT NETWORKS; RELIABILITY ANALYSIS; RELIABILITY THEORY; SYSTEMS ANALYSIS; UNCERTAINTY ANALYSIS;

QUALITY ASSURANCE;

EID: 78049369131     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2010.09.002     Document Type: Article

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