An analysis of Y2O3:Eu3 thin films for thermographic phosphor applications

Journal of Luminescence

Volumn 131, Issue 1, 2011, Pages 41-48

  Bosze, Eric J ^a   Hirata, Gustavo A ^b   McKittrick, Joanna ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Europium; Luminescence properties; Thermographic phosphor; Thin film; Yttrium oxide

Indexed keywords

AVERAGE RATE; COMPARATIVE STUDIES; CUBIC PHASE; CUBIC PHASIS; LINEAR DEPENDENCE; LUMINESCENCE PROPERTIES; LUMINESCENT PROPERTY; PHOSPHOR POWDERS; RATE OF CHANGE; REMOTE TEMPERATURE MEASUREMENTS; SILICON SUBSTRATES; SYNTHESIZED POWDER; THERMOGRAPHIC PHOSPHORS; THIN FILMS-SPUTTERED;

EUROPIUM; LUMINESCENCE; LUMINESCENCE OF INORGANIC SOLIDS; PHOSPHORS; POWDERS; THERMOGRAPHY (TEMPERATURE MEASUREMENT); THIN FILMS; VAPOR DEPOSITION; YTTRIUM; YTTRIUM OXIDE;

YTTRIUM ALLOYS;

EID: 78049293201     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2010.08.025     Document Type: Article

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