Characterization of photoluminescent (Y1-xEux)2O3 thin films prepared by metallorganic chemical vapor deposition

Journal of the American Ceramic Society

Volumn 83, Issue 5, 2000, Pages 1241-1246

  McKittrick, Joanna ^a   Bacalski, Carlos F ^a   Hirata, G A ^a   Hubbard, Kevin M ^b   Pattillo, S G ^b   Salazar, Kenneth V ^b   Trkula, M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); EUROPIUM; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; PHOTOLUMINESCENCE; SAPPHIRE; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS;

CRYSTALLITE SIZE; MICROSTRUCTURAL MORPHOLOGY; PHOTOLUMINESCENCE EMISSION SPECTRA; SURFACE GRAIN BOUNDARY AREA REDUCTION EFFECT;

YTTRIUM COMPOUNDS;

EID: 0033729138     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01361.x     Document Type: Article

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