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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 22, 2010, Pages 3438-3442

Improved detection limits in PIXE analysis employing wavelength dispersive X-ray spectroscopy

(1) Kavcic M a

a JO EF STEFAN INSTITUTE (Slovenia)

Author keywords

Minimum detection limit; Proton induced X ray emission; Wavelength dispersive crystal spectrometer

Indexed keywords

ATOMIC NUMBERS; CRYSTAL SPECTROMETER; DETECTION LIMITS; ENERGY RESOLUTIONS; L X-RAYS; LOWER DETECTION LIMIT; MATRIX; NATURAL LINEWIDTHS; PIXE ANALYSIS; PROTON INDUCED X-RAY EMISSION; TARGET MATRICES; TRACE AMOUNTS; WAVELENGTH DISPERSIVE CRYSTAL SPECTROMETER; WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPIES; X-RAY EMISSION SPECTRA;

ATOMIC SPECTROSCOPY; ATOMS; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; ION BEAMS; PALLADIUM; PROTONS; SPECTROMETRY; TERNARY SYSTEMS; TRACE ANALYSIS; TRACE ELEMENTS; X RAY SCATTERING; X RAY SPECTROMETERS; X RAY SPECTROSCOPY; X RAYS;

WAVELENGTH DISPERSIVE SPECTROSCOPY;

EID: 78049248105 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2010.09.003 Document Type: Article

Times cited : (12)

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