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Volumn 21, Issue 39, 2010, Pages

Rigorous surface enhanced Raman spectral characterization of large-area high-uniformity silver-coated tapered silica nanopillar arrays

Author keywords

[No Author keywords available]

Indexed keywords

6 INCH WAFERS; ANALYTICAL TECHNIQUES; BENZENETHIOLS; BIOLOGICAL APPLICATIONS; ENHANCEMENT FACTOR; LASER INTERFERENCE LITHOGRAPHY; NANO-PILLAR ARRAYS; NANOPILLAR; OPTICAL CHARACTERIZATION; RAMAN ENHANCEMENT; REPRODUCIBILITIES; SERS SUBSTRATE; SPECTRAL CHARACTERIZATION; SURFACE ENHANCED RAMAN; SURFACE ENHANCED RAMAN SPECTROSCOPY; ULTRAHIGH SENSITIVITY;

EID: 77958582527     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/39/395701     Document Type: Article
Times cited : (72)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.