On-chip aging sensor circuits for reliable nanometer MOSFET digital circuits

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 57, Issue 10, 2010, Pages 798-802

  Kim, Kyung Ki ^a   Wang, Wei ^b   Choi, Ken ^b  

^a Daegu University   (South Korea)

^b Illinois Institute of Technology   (United States)

Author keywords

Aging; degradation; hot carrier injection (HCI); negative bias temperature instability (NBTI); reliability

Indexed keywords

AGING OF MATERIALS; BIAS VOLTAGE; DEGRADATION; DIGITAL CIRCUITS; ELECTRIC CURRENTS; HOT CARRIERS; MOSFET DEVICES; NEGATIVE BIAS TEMPERATURE INSTABILITY; NEGATIVE TEMPERATURE COEFFICIENT; PHASE COMPARATORS; PREDICTIVE ANALYTICS; RELIABILITY; THERMODYNAMIC STABILITY; THRESHOLD VOLTAGE; TIMING CIRCUITS;

ACCURATE PERFORMANCE; ADAPTIVE DESIGN TECHNIQUES; CIRCUIT STRUCTURES; HOT CARRIER INJECTION; PERFORMANCE DEGRADATION; TEMPERATURE VARIATION; THRESHOLD VOLTAGE DEGRADATION; THRESHOLD VOLTAGE SHIFTS;

COMPUTER CIRCUITS;

EID: 77958485193     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2010.2067810     Document Type: Article

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