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Volumn 528, Issue 1, 2010, Pages 449-458

On characterization of deformation microstructure in Boron modified Ti-6Al-4V alloy

Author keywords

Boron modification; Electron back scatter diffraction; Titanium alloys; Warm deformation

Indexed keywords

ALUMINUM ALLOYS; BACKSCATTERING; BORON; DEFORMATION; DIFFRACTION; GRAIN BOUNDARIES; GRAIN REFINEMENT; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; STRAIN RATE; TERNARY ALLOYS; VANADIUM ALLOYS;

EID: 77958453562     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2010.09.026     Document Type: Article
Times cited : (61)

References (27)
  • 3
    • 0026360706 scopus 로고
    • Budinski K.G. Wear 1991, 151:203-217.
    • (1991) Wear , vol.151 , pp. 203-217
    • Budinski, K.G.1
  • 17
    • 85162791336 scopus 로고    scopus 로고
    • X-ray Diffraction Line Profile Analysis of Deformation Microstructure in Boron Modified Ti-6Al-4V Alloy, Mater. Charact., Submitted.
    • A. Sarkar, S. Roy, S. Suwas, X-ray Diffraction Line Profile Analysis of Deformation Microstructure in Boron Modified Ti-6Al-4V Alloy, Mater. Charact., Submitted.
    • Sarkar, A.1    Roy, S.2    Suwas, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.