Charge-selective raman scattering and fluorescence quenching by "nanometal on Semiconductor" substrates

Nano Letters

Volumn 10, Issue 10, 2010, Pages 3880-3887

  Bhatt, Karthik ^a   Tan, Susheng ^b,c   Karumuri, Sriharsha ^a   Kalkan, A Kaan ^a  

^a Oklahoma State University   (United States)

^b OKLAHOMA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

charge selective; fluorescence quenching; Surface enhanced Raman scattering

Indexed keywords

AG NANOPARTICLE; CHARGE-SELECTIVE; CHEMICAL REDUCTION; FLUORESCENCE QUENCHING; LEVEL DIFFERENCE; NANO-METAL; NANOPARTICLE CHARGING; NANOPARTICLE SIZES; P-TYPE SI; PLASMON HYBRIDIZATION; SELECTIVE SURFACE; SELF-INHIBITION; SURFACE-ENHANCED RAMAN SCATTERING;

COALESCENCE; ELECTRIC FORCE MICROSCOPY; FERMI LEVEL; FLUORESCENCE; NANOPARTICLES; QUENCHING; SCATTERING; SILVER; SUBSTRATES; SURFACES;

RAMAN SCATTERING;

EID: 77958075029     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl101480n     Document Type: Article

References (41)

1. Haes, A. J.; Hall, W. P.; Chang, L.; Klein, W. L.; Van Duyne, R. P. Nano Lett. 2004, 4, 1029-1034
2. Haes, A. J.; Van Duyne, R. P. J. Am. Chem. Soc. 2002, 124, 10596-10604
3. Haes, A. J.; Zou, S.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 2004, 108, 6961-6968
4. Yonzon, C. R.; Jeoung, E.; Zou, S.; Schatz, G. C.; Mrksich, M.; Van Duyne, R. P. J. Am. Chem. Soc. 2004, 126, 12669-12676
5. Singhal, K.; Kalkan, A. K. J. Am. Chem. Soc. 2009, 132, 429-431
6. Kalkan, A. K.; Fonash, S. J. Appl. Phys. Lett. 2006, 89, 233103
7. Wang, Z.; Rothberg, L. J. Appl. Phys. B 2006, 84, 289-293
8. Jensen, T. R.; Malinsky, M. D.; Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2000, 104, 10549-10556
9. Stuart, H. R.; Hall, D. G. Appl. Phys. Lett. 1996, 69, 2327
10. Atwater, H. A.; Polman, A. Nat. Mater. 2010, 9, 205-213
11. Mirin, N. A.; Halas, N. J. Nano Lett. 2009, 9, 1255-1259
12. Nomura, W.; Ohtsu, M.; Yatsui, T. Appl. Phys. Lett. 2005, 86, 181108
13. Li, M.; Schnablegger, H.; Mann, S. Nature 1999, 402, 393-395
14. Alvarez-Puebla, R. A.; Arceo, E.; Goulet, P. J. G.; Garrido, J. J.; Aroca, R. F. J. Phys. Chem. B 2005, 109, 3787-3792
15. Kumar, A.; Joshi, H.; Pasricha, R.; Mandale, A. B.; Sastry, M. J. Colloid Interface Sci. 2003, 264, 396-401
16. Mafune, F.; Kohno, J.; Takeda, Y.; Kondow, T.; Sawabe, H. J. Phys. Chem. B 2000, 104, 8333-8337
17. Wang, W.; Efrima, S.; Regev, O. Langmuir 1998, 14, 602-610
18. Kalkan, A. K.; Fonash, S. J. J. Phys. Chem. B 2005, 109, 20779-20785
19. Makov, G.; Nitzan, A.; Brus, L. E. J. Chem. Phys. 1988, 88, 5076-5085
20. Sze, S. M. Physics of Semiconductor Devices; Wiley: New York, 1969.
21. Wood, D. M. Phys. Rev. Lett. 1981, 46, 749
22. Nakayama, K.; Tanabe, K.; Atwater, H. A. Appl. Phys. Lett. 2008, 93, 121904
23. Catchpole, K. R.; Polman, A. Opt. Express 2008, 16, 21793-21800
24. Jain, P. K.; El-Sayed, M. A. Nano Lett. 2008, 8, 4347-4352
25. Nordlander, P.; Oubre, C.; Prodan, E.; Li, K.; Stockman, M. I. Nano Lett. 2004, 4, 899-903
26. Kreibig, U.; Vollmer, M. Optical Properties of Metal Clusters; Springer: New York, 1995.
27. Street, R. A. Phys. Rev. Lett. 1982, 49, 1187
28. o = standard reduction potential of Ag, R = gas constant, T = temperature in Kelvin, F = Faraday constant.
29. Zimmermann, F.; Hossenfelder, D.; Panitz, C. J.; Wokaun, A. J. Phys. Chem. 1994, 98, 12796-12804
30. Zhang, J.; Badugu, R.; Lakowicz, J. R. Plasmonics 2008, 3, 3-11
31. Lakowicz, J. R. Anal. Biochem. 2005, 337, 171-194
32. Lakowicz, J. R.; Geddes, C.; Gryczynski, I.; Malicka, J.; Gryczynski, Z.; Aslan, K.; Lukomska, J.; Matveeva, E.; Zhang, J.; Badugu, R.; Huang, J. J. Fluoresc. 2004, 14, 425-441
33. Malicka, J.; Gryczynski, I.; Gryczynski, Z.; Lakowicz, J. R. Anal. Biochem. 2003, 315, 57-66
34. Tam, F.; Goodrich, G. P.; Johnson, B. R.; Halas, N. J. Nano Lett. 2007, 7, 496-501
35. Anger, P.; Bharadwaj, P.; Novotny, L. Phys. Rev. Lett. 2006, 96, 4
36. Gueroui, Z.; Libchaber, A. Phys. Rev. Lett. 2004, 93, 166108
37. Lindstrom, C. D.; Zhu, X. Y. Chem. Rev. 2006, 106, 4281-4300
38. Adams, D. M.; Brus, L.; Chidsey, C. E. D.; Creager, S.; Creutz, C.; Kagan, C. R.; Kamat, P. V.; Lieberman, M.; Lindsay, S.; Marcus, R. A.; Metzger, R. M.; Michel-Beyerle, M. E.; Miller, J. R.; Newton, M. D.; Rolison, D. R.; Sankey, O.; Schanze, K. S.; Yardley, J.; Zhu, X. J. Phys. Chem. B 2003, 107, 6668-6697
39. Sokolov, K.; Chumanov, G.; Cotton, T. M. Anal. Chem. 1998, 70, 3898-3905
40. Wokaun, A.; Lutz, H. P.; King, A. P.; Wild, U. P.; Ernst, R. R. J. Chem. Phys. 1983, 79, 509-514
41. Dulkeith, E.; Ringler, M.; Klar, T. A.; Feldmann, J.; Muñoz Javier, A.; Parak, W. J. Nano Lett. 2005, 5, 585-589