메뉴 건너뛰기




Volumn 2, Issue , 2005, Pages 713-716

Compiler-directed selective data protection against soft errors

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; EMBEDDED SYSTEMS; PROGRAM COMPILERS; RADIATION HARDENING;

EID: 77958024492     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1120725.1121000     Document Type: Conference Paper
Times cited : (9)

References (14)
  • 2
    • 0242443635 scopus 로고    scopus 로고
    • Measurements and analysis of ser tolerant latch in a 90nm dual-Vt CMOS process
    • September
    • P. Hazucha et al. Measurements and analysis of SER tolerant latch in a 90nm dual-Vt CMOS process. IEEE CICC, September 2003.
    • (2003) IEEE CICC
    • Hazucha, P.1
  • 3
    • 17644440390 scopus 로고    scopus 로고
    • Neutron soft error rate measurement in a 90-nm CMOS process and scaling trends in SRAM from 0.25um to 90nm generation
    • December
    • P. Hazucha et al. Neutron soft error rate measurement in a 90-nm CMOS process and scaling trends in SRAM from 0.25um to 90nm generation. IEDM, December 2003.
    • (2003) IEDM
    • Hazucha, P.1
  • 5
    • 0031118262 scopus 로고    scopus 로고
    • Extracting reusable functions by flow graph-based program slicing
    • G Lanubile and G Visaggio. Extracting reusable functions by flow graph-based program slicing. IEEE Transactions on Software Engineering, 23, pp. 246-259, 1997.
    • (1997) IEEE Transactions on Software Engineering , vol.23 , pp. 246-259
    • Lanubile, G.1    Visaggio, G.2
  • 7
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy based soft-error tolerance to rescue nanometer technologies
    • April
    • M. Nikoladis. Time redundancy based soft-error tolerance to rescue nanometer technologies. In Proc. IEEE 17th VLSI Test Symposium April 1999, pp. 86-94.
    • (1999) Proc. IEEE 17th VLSI Test Symposium , pp. 86-94
    • Nikoladis, M.1
  • 11
  • 12
    • 0034450666 scopus 로고    scopus 로고
    • Predicting error rate for microprocessor based digital architectures through C.E.U. (Code Emulating Upsets) injection
    • R. Velazco, S. Rezgui, R. Ecoffet. Predicting error rate for microprocessor based digital architectures through C.E.U. (Code Emulating Upsets) injection. IEEE Transactions on Nuclear Science Vol. 47, No. 6, 2000, pp. 2405-2411
    • (2000) IEEE Transactions on Nuclear Science , vol.47 , Issue.6 , pp. 2405-2411
    • Velazco, R.1    Rezgui, S.2    Ecoffet, R.3
  • 14
    • 0029732375 scopus 로고    scopus 로고
    • IBM experiments in soft fails in computer electronics (1978-1994)
    • J. P. Ziegler et.al. IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development 1996, Vol. 40. No.l, pp. 3-18
    • (1996) IBM Journal of Research and Development , vol.40 , Issue.1 , pp. 3-18
    • Ziegler, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.