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Volumn , Issue , 2010, Pages 219-220

A 2.4μA continuous-time electrode-skin impedance measurement circuit for motion artifact monitoring in ECG acquisition systems

Author keywords

[No Author keywords available]

Indexed keywords

AC CURRENTS; ACQUISITION SYSTEMS; CMOS PROCESSS; CONTINUOUS TIME; ECG MONITORING; ECG SIGNALS; ELECTRODE-SKIN IMPEDANCE; IMPEDANCE MEASUREMENT; MEASURED IMPEDANCE; MOTION ARTIFACT; POST PROCESSING; REFERENCE SIGNALS;

EID: 77958021201     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIC.2010.5560290     Document Type: Conference Paper
Times cited : (40)

References (7)
  • 1
    • 25144471566 scopus 로고    scopus 로고
    • Active motion artifact cancellation for wearable health monitoring sensors using collocated MEMS accelerometers
    • P. T. Gibbs, et al., "Active motion artifact cancellation for wearable health monitoring sensors using collocated MEMS accelerometers," Proc. SPIE, 2005.
    • (2005) Proc. SPIE
    • Gibbs, P.T.1
  • 2
    • 0034478046 scopus 로고    scopus 로고
    • Comparison of methods for adaptive removal of motion artifact
    • P.S. Hamilton, et al., "Comparison of Methods for Adaptive Removal of Motion Artifact," Computers in Cardiology, pp. 383-386, 2000.
    • (2000) Computers in Cardiology , pp. 383-386
    • Hamilton, P.S.1
  • 3
    • 61849106756 scopus 로고    scopus 로고
    • An approach to reliable motion artifact detection for mobile long-term ECG monitoring systems using dry electrodes
    • J. Ottenbacher, et al., "An approach to reliable motion artifact detection for mobile long-term ECG monitoring systems using dry electrodes," Proc. IFMBE, pp. 440-443, 2007.
    • (2007) Proc. IFMBE , pp. 440-443
    • Ottenbacher, J.1
  • 4
    • 57649232148 scopus 로고    scopus 로고
    • An improved Method to continuously monitor the Electrode-Skin Impedance during Bioelectric Measurements
    • Thomas Degen, et al., "An improved Method to continuously monitor the Electrode-Skin Impedance during Bioelectric Measurements," Proc. IEEE EMBC, pp. 6294-5297, 2007.
    • (2007) Proc. IEEE EMBC , pp. 6294-5297
    • Degen, T.1
  • 6
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effects of opamp imperfections
    • C.C. Enz, et al., "Circuit techniques for reducing the effects of opamp imperfections," Proc. IEEE, vol 84, pp.1584-1614, 1996.
    • (1996) Proc. IEEE , vol.84 , pp. 1584-1614
    • Enz, C.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.