The use of Full-Field XRF for simultaneous elemental mapping

AIP Conference Proceedings

Volumn 1221, Issue , 2010, Pages 111-118

  Alfeld, M ^a   Janssens, K ^a   Sasov, A ^b   Liu, X ^b   Kostenko, A ^c   Rickers Appel, K ^d   Falkenberg, G ^d  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b SkyScan ^*  (Belgium)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^d DESY   (Germany)

Author keywords

Full Field X ray Fluorescence; Pixel detector; Simultaneous elemental mapping; X ray fluorescence

Indexed keywords

EID: 77957991985     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3399236     Document Type: Conference Paper

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