Planning life tests for reliability demonstration

Quality Progress

Volumn 37, Issue 8, 2004, Pages 80-82

  Meeker, William Q ^a   Hahn, Gerald J ^b   Doganaksoy, Necip ^b  

^a IOWA STATE UNIVERSITY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PRODUCT RELEASE DECISIONS; RELIABILITY DEMONSTRATION; SYSTEM RELIABILITY;

FAILURE ANALYSIS; PROBABILITY; PRODUCT DESIGN; RELIABILITY; STATISTICAL METHODS; TESTING; WEIBULL DISTRIBUTION;

PLANNING;

EID: 4344628839     PISSN: 0033524X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (8)

1. Harry McLean, HALT, HASS and HASA Explained: Accelerated Reliability Techniques, ASQ Quality Press, 2000.
2. G.J. Hahn, "Minimum Size Sampling Plans," Journal of Quality Technology, Vol. 6, No. 3, pp. 121-127.
3. W.Q. Meeker and L.A. Escobar, Statistical Methods for Reliability Data, John Wiley and Sons, 1998, sections 10.6 and 8.5.2.
4. I b i d.
5. I b i d.
6. I b i d.
7. G.J. Hahn, W.Q. Meeker and Necip Doganaksoy, "Speedier Reliability Analysis," Quality Progress, June 2003, pp. 58-63.
8. Wayne Nelson, Accelerated Testing: Statistical Models, Test Plans and Data Analyses, John Wiley and Sons, 1990.