Scaling reliability and modeling of ferroelectric capacitors

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 689-693

  Acosta, Antonio G ^a   Rodriguez, John ^b   Obradovic, Borna ^b   Summerfelt, Scott ^b   San, Tamer ^b   Green, Keith ^b   Moise, Ted ^b   Krishnan, Srikanth ^b  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

Ferroelectric capacitor; FRAM; Reliability; SPICE model

Indexed keywords

CIRCUIT BEHAVIORS; END OF LIVES; EXPERIMENTAL DATA; FERROELECTRIC CAPACITORS; FRAM; MOCVD; PZT; RELIABILITY PROPERTIES; SIGNAL MARGINS; SPICE MODEL; SWITCHING POLARIZATION;

CAPACITORS; FERROELECTRICITY; POLARIZATION; RELIABILITY; SPICE;

FERROELECTRIC DEVICES;

EID: 77957908461     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488748     Document Type: Conference Paper

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