Silver artefacts: Plasma deposition of SiOx protective layers and tarnishing evolution assessment

Corrosion Engineering Science and Technology

Volumn 45, Issue 5, 2010, Pages 334-340

  Angelini, E ^a   Grassini, S ^a   Parvis, M ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Cultural heritage; Electrochemical impedance; Silver; SiOx protective films; Tarnishing

Indexed keywords

BARRIER EFFECTS; BARRIER PROPERTIES; COATED SURFACE; CULTURAL HERITAGES; DIAGNOSTIC TOOLS; DIGITAL PHOTOGRAPHY; ELECTROCHEMICAL IMPEDANCE; ELECTROCHEMICAL IMPEDANCE MEASUREMENTS; FEEDING GAS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; OPTICAL TRANSPARENCY; PROTECTIVE FILMS; PROTECTIVE LAYERS; RF PLASMA; TARNISHING;

ELECTROCHEMICAL CORROSION; FIELD EMISSION; FIELD EMISSION MICROSCOPES; GAS PERMEABLE MEMBRANES; IMAGE PROCESSING; OPTICAL DATA PROCESSING; PLASMA DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SILVER ALLOYS; SODIUM; SULFUR; VAPORS;

SILVER;

EID: 77957901869     PISSN: 1478422X     EISSN: 17432782     Source Type: Journal    
DOI: 10.1179/147842210X12767807773484     Document Type: Article

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