Application of a statistical compact model for random telegraph noise to scaled-SRAM Vmin analysis

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 95-96

  Tanizawa, M ^a   Ohbayashi, S ^a   Okagaki, T ^a   Sonoda, K ^a   Eikyu, K ^a   Hirano, Y ^a   Ishikawa, K ^a   Tsuchiya, O ^a   Inoue, Y ^a  

^a RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT MODEL; EXPERIMENTAL OBSERVATION; LOG-NORMAL; RANDOM TELEGRAPH NOISE; SHIFT-AND; TRAP TIME;

NORMAL DISTRIBUTION; TELEGRAPH;

STATIC RANDOM ACCESS STORAGE;

EID: 77957880623     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556184     Document Type: Conference Paper

References (10)

1. N.Tega et al., Proc. IRPS, pp. 541-546, 2008.
2. S.O.Toh et al., IEDM Tech. Dig., pp. 767-770, 2009.
3. C.M.Compagnoni et al., IEEE TED, Vol.55, No.1, pp.388-395, Jan. 2008.
4. K.Fukuda et al., IEDM Tech. Dig., pp. 169-172, 2007.
5. K.Takeuchi et al., Symp. VLSI Tech. Dig., pp. 54-55, 2009.
6. N.H.Hamid et al., IEEE TCAS-1, Vol.55, No.1, pp.245-257, Feb. 2008.
7. T.Shimizu et al., Proc. IRPS, pp. 389-394, 2009.
8. T.Nagumo et al., IEDM Tech. Dig., pp. 759-762, 2009.
9. M.Yabuuchi et al., ISSCC Dig., pp. 326-327, 2007.
10. Z.Guo et al., IEEE JSSC, Vol.44, No.11, pp.3174-3192, Nov. 2009.