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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7773, Issue , 2010, Pages

Degradation of photovoltaic modules under high voltage stress in the field

(2) Del Cueto, J A a Rummel, S R a

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

Degradation; High voltage stress; Leakage currents; Photovoltaic; Reliability

Indexed keywords

AIR TEMPERATURE; BULK SILICON; DATA ACQUISITION SYSTEM; HIGH VOLTAGE; HIGH-VOLTAGE STRESS; LEAKAGE PATHS; LOSS RATES; MOISTURE CONDITIONS; PHOTOVOLTAIC; PHOTOVOLTAIC MODULES; POLY-CRYSTALLINE SILICON; THIN FILM SILICON; TRIPLE-JUNCTIONS;

AMORPHOUS FILMS; AMORPHOUS SILICON; ATMOSPHERIC HUMIDITY; DEGRADATION; MOISTURE DETERMINATION; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; POLYSILICON; RELIABILITY;

LEAKAGE CURRENTS;

EID: 77957837237 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.861226 Document Type: Conference Paper

Times cited : (18)

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