Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Ruther, R ^a   Del Cueto, J ^b   Tamizh Mani, G ^c   Montenegro, A A ^a   Rummel, S ^b   Anderberg, A ^b   Von Roedern, B ^b  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON (A-SI); CHARACTERISTIC TEMPERATURE; LIGHT-INDUCED DEGRADATION; OUTPUT PARAMETERS; PERFORMANCE LEVEL; PERFORMANCE TESTS; STABILIZATION CHARACTERISTICS; STABILIZATION EFFECTS;

DEGRADATION; EXPERIMENTS; PHOTOVOLTAIC CELLS; SILICON; STABILIZATION;

AMORPHOUS SILICON;

EID: 84879721335     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922773     Document Type: Conference Paper

References (12)

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