Synchrotron XPS, NEXAFS, and ToF-SIMS studies of solution exposed chalcopyrite and heterogeneous chalcopyrite with pyrite

Minerals Engineering

Volumn 23, Issue 11-13, 2010, Pages 928-936

  Acres, Robert G ^a   Harmer, Sarah L ^a   Beattie, David A ^a  

^a UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

Leaching; Oxidation; Sulfide ores

Indexed keywords

FRACTURE SURFACES; GRAIN SIZE; HCL SOLUTION; MINERAL PHASIS; MINERAL SURFACES; NEAR-EDGE X-RAY ABSORPTION; PASSIVATING LAYER; ROUGH FRACTURES; SULFIDE ORES; SURFACE SPECIES; SYNCHROTRON X-RAY PHOTOELECTRON SPECTROSCOPIES; SYNCHROTRON XPS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS ANALYSIS;

ABSORPTION SPECTROSCOPY; FLUORESCENCE SPECTROSCOPY; FRACTURE; HYDROCHLORIC ACID; LEACHING; OXIDATION; SECONDARY ION MASS SPECTROMETRY; SILICATE MINERALS; SULFUR; SURFACE ANALYSIS; SURFACE ROUGHNESS; SYNCHROTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER COMPOUNDS;

EID: 77957834137     PISSN: 08926875     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mineng.2010.03.007     Document Type: Conference Paper

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