An improved capacitance measurement technique based of RC phase delay

2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

Volumn , Issue , 2010, Pages 367-370

  Dean, Robert N ^a   Rane, Aditi ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

Capacitance measurement; CMOS interface circuit; Pulse width modulation

Indexed keywords

CMOS INTERFACE CIRCUIT; LINEAR RESPONSE; LOW-PASS; MOSFET SWITCHES; NON-LINEARITY; OUTPUT PULSE; PHASE DELAY; PROTOTYPE CIRCUITS; PULSE-WIDTH-MODULATED; RC NETWORKS; SQUARE WAVES; VARIABLE CAPACITOR;

CAPACITANCE; CAPACITORS; INSTRUMENTS; LOGIC CIRCUITS; MEASUREMENT THEORY; PULSE WIDTH MODULATION; VARIABLE FREQUENCY OSCILLATORS;

CAPACITANCE MEASUREMENT;

EID: 77957825950     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2010.5488213     Document Type: Conference Paper

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