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Journal of Applied Physics

Volumn 108, Issue 6, 2010, Pages

Probing defects in chemically synthesized ZnO nanostrucures by positron annihilation and photoluminescence spectroscopy

(4) Chaudhuri, S K a Ghosh, Manoranjan b Das, D a Raychaudhuri, A K b

a UGC DAE (India)

b S N BOSE NATIONAL CENTRE FOR BASIC SCIENCES (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED OXYGEN VACANCIES; CRITICAL SIZE; INTRINSIC DEFECTS; NANOCRYSTALLINE ZNO; PHOTOLUMINESCENCE PROPERTIES; POSITIVE SURFACE CHARGE; SPHERICAL PARTICLE; STRUCTURAL ARRANGEMENT; ZINC VACANCY; ZNO; ZNO NANOPARTICLES;

DEFECTS; ELECTRONS; NANOPARTICLES; OXYGEN; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; X RAY DIFFRACTION; ZINC OXIDE;

OXYGEN VACANCIES;

EID: 77957741657 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3483247 Document Type: Article

Times cited : (33)

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