Nanoparticle detection using dual-phase interferometry

Applied Optics

Volumn 49, Issue 26, 2010, Pages 4921-4925

  Deutsch, Bradley ^a   Beams, Ryan ^a   Novotny, Lukas ^a,b  

^a UNIVERSITY OF ROCHESTER   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT SCATTERING; NANOPARTICLES; SEMICONDUCTOR DEVICE MANUFACTURE;

ATMOSPHERIC MONITORING; DETECTION AND IDENTIFICATIONS; DETECTION SCHEME; ELASTIC LIGHT SCATTERING; INTERFEROMETRIC DETECTION; OPTICAL COMPONENTS; PHASE SENSITIVE; SEMICONDUCTOR MANUFACTURING;

SIGNAL TO NOISE RATIO;

GOLD; NANOPARTICLE;

ARTICLE; ENVIRONMENTAL MONITORING; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; RADIATION SCATTERING;

ENVIRONMENTAL MONITORING; GOLD; INTERFEROMETRY; NANOPARTICLES; SCATTERING, RADIATION;

EID: 77957578133     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.004921     Document Type: Article

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