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Volumn 82, Issue 7, 2010, Pages

Dynamics of charge trapping by electron-irradiated alumina

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EID: 77957566766     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.075132     Document Type: Article
Times cited : (18)

References (15)
  • 1
    • 11944267622 scopus 로고
    • 10.1088/0034-4885/53/11/002
    • J. H. Harding, Rep. Prog. Phys. 53, 1403 (1990). 10.1088/0034-4885/53/11/ 002
    • (1990) Rep. Prog. Phys. , vol.53 , pp. 1403
    • Harding, J.H.1
  • 4
    • 77954804452 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.81.054307
    • C. Bonnelle, Phys. Rev. B 81, 054307 (2010). 10.1103/PhysRevB.81.054307
    • (2010) Phys. Rev. B , vol.81 , pp. 054307
    • Bonnelle, C.1
  • 8
    • 11244353348 scopus 로고    scopus 로고
    • 10.1017/S1431927604040620
    • C. Bonnelle, Microsc. Microanal. 10, 691 (2004). 10.1017/ S1431927604040620
    • (2004) Microsc. Microanal. , vol.10 , pp. 691
    • Bonnelle, C.1
  • 12
    • 77957606470 scopus 로고    scopus 로고
    • NIST electron effective-attenuation-length database
    • NIST electron effective-attenuation-length database, http://www.nist.gov/ srd/nist82.htm
  • 14
    • 77957589939 scopus 로고    scopus 로고
    • Ph.D. thesis, Université de Nice-Sophia-Antipolis
    • G. Molnar, Ph.D. thesis, Université de Nice-Sophia-Antipolis, 2000.
    • (2000)
    • Molnar, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.